{"product_id":"tested-veeco-dimension-3100-afm-atomic-force-microscope-c-afm-system-w-ec-option","title":"TESTED Veeco Dimension 3100 AFM Atomic Force Microscope C-AFM System w EC Option","description":"\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003eVeeco DI Dimension 3100 AFM Atomic Force Microscope System W\/ C-AFM Sensor Module\u003c\/p\u003e\u003cbr\u003e\u003cdiv\u003e\u003cbr\u003e\u003c\/div\u003e\u003cdiv\u003e\n\u003cdiv\u003eTo watch a video of a technician interacting with this system in various different modes of operastion, please follow the links below:\u003c\/div\u003e\n\u003cdiv\u003eContact AFM: youtube.com\/watch?v=iAkzqdI_10Q\u003c\/div\u003e\n\u003cdiv\u003eConductive AFM: youtube.com\/watch?v=p0q1JNIE7W8\u003c\/div\u003e\n\u003cdiv\u003eEquipment: youtube.com\/watch?v=XXaNDbx_L6M\u003c\/div\u003e\n\u003c\/div\u003e\u003cdiv\u003e\u003cbr\u003e\u003c\/div\u003e\u003cdiv\u003e\u003cbr\u003e\u003c\/div\u003e\u003cbr\u003e\u003cbr\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e\u003cu\u003eTesting Included:\u003c\/u\u003e\u003c\/p\u003e\u003cbr\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003eGeneral functional testing was performed on the AFM system. The Dimension 3100 microscope, NanoScope IIIa controller, computer\/software, optics, and vibration isolation table were powered and operated together. Communication between the microscope and controller was confirmed, and the NanoScope software recognized and controlled the system.\u003c\/p\u003e\u003cbr\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003eThe optical system was tested by viewing the sample and cantilever, aligning the laser on the probe, adjusting the photodetector\/vertical deflection, and monitoring the laser SUM and deflection signals. The motorized approach and engage functions were tested, and the probe successfully engaged the sample surface. Contact AFM operation was tested using a patterned calibration\/sample surface. In the video below, we show an scanned image of the patterned silicon that we ran. The system successfully scanned the sample and produced recognizable topographic height images, including clearly resolved raised\/recessed square features. Scan size, scan rate, feedback gains, deflection setpoint, image scaling, trace\/retrace operation, and image capture functions were exercised during testing.\u003c\/p\u003e\u003cbr\u003e\u003cbr\u003e\u003cbr\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003eC-AFM\/Current AFM mode was also tested. The conductive AFM controls, sample bias, current sensitivity, current channel, conductive probe\/sample connections, and electrical continuity were checked. A current response was observed during testing, but a stable continuous C-AFM current image was not consistently obtained (conductivity is difficult to maintain). The resistor loop test worked perfectly and the system behaved normally, so we believe it is functioning as expected.\u003c\/p\u003e\u003cbr\u003e\u003cbr\u003e\u003cbr\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003eThe TMC pneumatic vibration isolation table was also operated and checked for proper inflation\/floating and isolation-table movement. However, the chuck vacuum system was not successfully tested. \u003c\/p\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e\u003cbr\u003e\u003c\/p\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003eWe did not test liquid EC AFM due to our last of experience, but the bipotentiostat power on, was recognized, and the dummy cell tests worked in the software properly.\u003c\/p\u003e\u003cbr\u003e\u003cbr\u003e\u003cbr\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003eOverall, the system was demonstrated to power on, communicate, engage a sample, scan, and acquire usable Contact AFM topography. C-AFM current measurement portion remains incompletely verified.\u003c\/p\u003e\u003cbr\u003e\u003cbr\u003e\u003cbr\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003eSale Includes the Following Items \u003c\/p\u003e\u003cbr\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e1x) DI Dimensions D3100S-1 AFM Stand\u003c\/p\u003e\u003cbr\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e1x) DI Dimensions D3100HP-2 Nanoscope Controller\u003c\/p\u003e\u003cbr\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e1x) DI Dimensions NS3a Nanoscope IIIa ADC5 Module\u003c\/p\u003e\u003cbr\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e1x) DI Dimensions 980-002-300 EC Universal Bipotentiostat Module\u003c\/p\u003e\u003cbr\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e1x) DI Dimensions Nanoscope Basic Quadrex Extender Module\u003c\/p\u003e\u003cbr\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e1x) DI Dimensions 931-000-002-R Veeco \/ Digital Instruments Dimension AFM Scanner Head, Standard 90 µm Open-Loop XYZ\u003c\/p\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e1x) DI C-AFM add-on capability module\u003c\/p\u003e\u003cbr\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e1x) TMC 63-30686-01 Pneumatic AFM Vibration Isolation Float Table\u003c\/p\u003e\u003cbr\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e1x) Veeco PC w\/ Windows XP OS \u0026amp; Nanoscope Software \u003c\/p\u003e\u003cbr\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e1x) Bruker DT2257X20V00GRY APEM Desktop Trackball \u003c\/p\u003e\u003cbr\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e1x) Dell CN-0N6250-71616-67H-05O4 Desktop Keyboard \u003c\/p\u003e\u003cbr\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e1x) Dell CN-0CC280-71618-6CN-AF82 Desktop Monitor \u003c\/p\u003e\u003cbr\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e1x) NEC LCD1770GX-BK MultiSynch LCD Monitor\u003c\/p\u003e\u003cbr\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e3x) DI Dimensions 464-000-00X 37-Pin Module Communication Cable\u003c\/p\u003e\u003cbr\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e1x) DI Dimensions 820-000-006 Nanoscope Power Cable \u003c\/p\u003e\u003cbr\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e1x) 78-Pin D Sub to 8x 9-Pin Serial Communication Cable\u003c\/p\u003e\u003cbr\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e3x) Male to Female 9-Pin Serial Communication Cable\u003c\/p\u003e\u003cbr\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e1x) Modified Bruker DTRCH-AM C-AFM Holder\u003c\/p\u003e\u003cbr\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e1x) Bruker DFMA Tapping\/Contact\/Magnetic Force AFM Probe Holder \u003c\/p\u003e\u003cbr\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e1x) Bruker 970-017-302 EC-AFM Probe Holder  w\/Skirt\u003c\/p\u003e\u003cbr\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e1x) Bruker AFM Probe Holder Stand for swapping cantilevers\u003c\/p\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e1x) Vibration and Acoustic Isolation Box with pneumatic dampening on wheels\u003c\/p\u003e\u003cbr\u003e\u003cbr\u003e\u003cbr\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003eThe Following Probes are Included as well. However these do not contain full\/complete sets of the cantilevers. Additionally, the condition of each individual probe has not been investigated under a microscope: \u003c\/p\u003e\u003cbr\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e1x) Veeco MESP Sb Doped Si Magentic Force Probe\u003c\/p\u003e\u003cbr\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e1x) Veeco FESP Sb Doped Si Probes\u003c\/p\u003e\u003cbr\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e1x) Nano Devices 97130 BioProbe\u003c\/p\u003e\u003cbr\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e1x) MikroMasch C031566 NSC15\/3 Noncontact Si Probe\u003c\/p\u003e\u003cbr\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e1x) MikroMasch C050163 NSC18\/Cr-Au  Noncontact Conductive Probe\u003c\/p\u003e\u003cbr\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e1x) MikroMasch C051239 NSC18\/Ti-Pt Noncontact Conductive Probe\u003c\/p\u003e\u003cbr\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e1x) MikroMasch C050854 NSC18\/Co-Cr Noncontact Magnetic Force Probe\u003c\/p\u003e\u003cbr\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e1x) K-TEK Tetra14\/18 SPM Probe\u003c\/p\u003e\u003cbr\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e1x) Bio Force Lab Methly GST.CH\/COOH Probes\u003c\/p\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003eProbe disclaimer: included probes are bonus consumables; quantities\/condition of individual cantilevers are not guaranteed.\u003c\/p\u003e\u003cbr\u003e\u003cbr\u003e\u003cbr\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003eDue to the size and weight of the entire system it must be delivered via freight shipping. Buyer responsible for the cost of freight shipping to their facility. Please note that this is a sophisticated research instrument and will require knowledgeable installation, setup, alignment, and configuration after delivery. While the system was tested and demonstrated to operate properly prior to shipment as described above, performance following freight transport may depend on proper reassembly, leveling, isolation-table setup, probe installation, optical alignment, and other routine AFM setup procedures. We do not include installation or tech support in the list price of this system. We may be able to offer it for an additional price, and also other companies can do this for an additional cost as well.\u003c\/p\u003e\u003cbr\u003e\u003cbr\u003e\u003cbr\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003eUsed, see photos.\u003c\/p\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e\u003cbr\u003e\u003c\/p\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e\u003cbr\u003e\u003c\/p\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e\u003cu\u003eThis system is exceptionally well equipped and supports a broad range of AFM\/SPM techniques, including:\u003c\/u\u003e\u003c\/p\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e* Contact Mode AFM\u003c\/p\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e* TappingMode AFM\u003c\/p\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e* Phase Imaging\u003c\/p\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e* Lateral \/ Friction Force Microscopy (LFM\/FFM)\u003c\/p\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e* Force Modulation Microscopy\u003c\/p\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e* Force-Distance \/ Force Spectroscopy\u003c\/p\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e* Force Volume Imaging\u003c\/p\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e* Magnetic Force Microscopy (MFM)\u003c\/p\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e* Electric Force Microscopy (EFM)\u003c\/p\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e* Surface Potential \/ Kelvin Probe-type Imaging\u003c\/p\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e* Conductive AFM (C-AFM)\u003c\/p\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e* Electrochemical AFM (EC-AFM)\u003c\/p\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e* Scanning Electrochemical Potential Microscopy (SECPM)\u003c\/p\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e* Liquid \/ Electrochemical AFM\u003c\/p\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e\u003cbr\u003e\u003c\/p\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003eThe system includes C-AFM electronics, a Universal Bipotentiostat, Quadrex extender, DFMA force-modulation holder, electrical and EC-AFM probe holders, and other specialized accessories supporting these techniques.\u003c\/p\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e\u003cbr\u003e\u003c\/p\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003eContact-mode AFM was fully demonstrated with successful sample imaging. C-AFM current response was also observed. Other specialized modes should be considered hardware-supported but untested by us and may require appropriate probes, cells, or additional experiment-specific accessories.\u003c\/p\u003e\u003cdiv\u003e\u003cbr\u003e\u003c\/div\u003e\u003cbr\u003e\u003cbr\u003e\u003cbr\u003e\u003cp dir=\"ltr\" style=\"margin-top:0; margin-bottom:0;\"\u003e-BJ\u003c\/p\u003e","brand":"Lab Liquidators Store","offers":[{"title":"Default Title","offer_id":56315984970020,"sku":"SP111117721","price":38900.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0748\/5289\/2964\/files\/10_b0c96905-ddce-4010-b022-2a5c5ec96970.jpg?v=1789659707","url":"https:\/\/store.labliquidators.com\/products\/tested-veeco-dimension-3100-afm-atomic-force-microscope-c-afm-system-w-ec-option","provider":"Lab Liquidators Store","version":"1.0","type":"link"}