NT-MDT NTEGRA Spectra SNOM STM AFM Atomic Force Confocal Microscope System
For sale is NT-MDT's original NTEGRA Spectra - Integration of SPM and confocal microscopy system. Made by Molecular Devices and Tools for Nanotechnology company around the year 2010. This system was decommissioned formerly by a university and they took out the hard drive with the software. As such, this system is not fully tested and we can only speak to the hardware. We were offered a copy of the software by the OEM for about $9,000. We make no guarantee that the software is the only thing needed to make this system functional, we are not experts with this system. See photos. This system is in "used" condition and as such may have small scratches, dents, and other imperfections. Base unit powers on when plugged into the controllers.
Includes the following in purchase:
-Base unit, includes overhead CCD and optics, as well as laser radiation IO module
-Scanner
-Optical measuring head 830 w/ AFM probe holder
-AFM head (universal measuring head)
-STM head
-2x NTEGRA Controllers
-NS USB Interface
-Control PC w/ PCI cards (missing HDD, top cover, and possible more)
-STELLAR-PRO-L 514nm Modu-Laser w/ OTS mount and fan cooler
-MS 5004i NTEGRA Spectrometer spectral unit w/ Andor DV401-BV CCD
-Many interconnecting cables (mostly DB-9), accessories, fittings, brackets etc
Due to the large size and weight of this system, it will ship via freight. Ships for free dock-to-dock anywhere in the continental USA.
From the manufacturer:
"SPECIFICATIONS
– Confocal Raman/Fluorescence microscopy
– AFM/STM: Integration with spectroscopy
– Spectroscopy
– Scanning Near Field Optical Microscopy (SNOM)
– Optimized for Tip Enhanced Raman Scattering (TERS) and other tip-related optical techniques
– (S-SNOM, SNIM, TEFS, STM-LE etc.) Confocal Raman/Fluorescence microscopy
– Confocal Raman/Fluorescence/Rayleigh imaging runs simultaneously with AFM (during one sample scan)
– Diffraction limited spatial resolution: 200 nm in XY, 500 nm in Z (with immersion objective)
– True confocality; push button from software to control the motorized confocal pinhole for optimal signal and confocality
– Motorized variable beam expander/collimator: adjusts diameter and collimation of the laser beam individually for each laser and each objective used
– Full 3D (XYZ) confocal imaging with powerful image analysis
– Hyperspectral imaging (recording complete Raman spectrum in every point of 1D, 2D or 3D confocal scan) with further software analysis
– Optical lithography (vector, raster) AFM/STM: Integration with spectroscopy
– Upright and Inverted optical AFM configurations (optimized for opaque and transparent samples correspondingly);
– side illumination option
– Highest possible resolution (numerical aperture) optics is used simultaneously with AFM: 0.7 NA for Upright, 1.3–1.4 NA for Inverted
– AFM/STM and confocal Raman/Fluorescence images are obtained simultaneously (during one scan)
– All standard SPM imaging modes are supported (30 modes) — combined with confocal Raman/Fluorescence
– Low noise AFM/STM (atomic resolution)
– Vibrations and thermal drifts originating from optical microscope body are minimized due to special design of optical AFM heads
– Focus track feature: sample always stays in focus due to AFM Z-feedback; high quality confocal images of very rough or inclined samples can be obtained
Spectroscopy*
– Extremely high efficiency 520 mm length spectrometer with 4 motorized gratings
– Visible, UV and IR spectral ranges available
– Echelle grating with ultrahigh dispersion; spectral resolution: 0.007 nm (< 0.1 1/cm)**
– Up to 3 different detectors can be installed
– TE cooled (down to -100 ºC) CCD camera. EMCCD camera is optional — for ultrafast imaging
– Photon multiplier (PMT) or avalanche photodiode in photon counting mode
– Photon multiplier for fast confocal laser (Rayleigh) imaging
– Flexible motorized polarization optics in excitation and detection channels, cross-polarized Raman measurements
– Fully automated switch between different lasers — with a few mouse clicks Scanning Near Field Optical Microscopy (SNOM)*
– Two major SNOM techniques supported: (i) based on quartz fiber probes, (ii) based on silicon cantilever probes
– All modes supported: Transmission, Collection, Reflection
– All SNOM signals detected: laser intensity, fluorescence intensity, spectroscopy
– SNOM lithography (vector, raster)
Optimized for Tip Enhanced Raman Scattering (TERS) and other tip-related optical techniques (S-SNOM, SNIM, TEFS, STM-LE etc.)
– All existing TERS geometries are available: illumination / collection from bottom, from top or from side
– Different SPM techniques and TERS probes can be used: STM, AFM cantilever, quartz tuning fork in tapping and shear force modes
– Dual scan (for Hot Point Mapping in TERS): scan by sample AND scan by tip / by laser spot
– Motorized polarization optics to produce optimal polarization for TERS AFM-Raman measurements can run in air, in controlled atmosphere or in liquid — all with variable temperature (for Inverted configuration)
– Some features listed are optional — not included into basic system configuration"
