TESTED Veeco Dimension 3100 AFM Atomic Force Microscope C-AFM System w EC Option

Veeco DI Dimension 3100 AFM Atomic Force Microscope System W/ C-AFM Sensor Module

Testing Included:

General functional testing was performed on the AFM system. The Dimension 3100 microscope, NanoScope IIIa controller, computer/software, optics, and vibration isolation table were powered and operated together. Communication between the microscope and controller was confirmed, and the NanoScope software recognized and controlled the system.

The optical system was tested by viewing the sample and cantilever, aligning the laser on the probe, adjusting the photodetector/vertical deflection, and monitoring the laser SUM and deflection signals. The motorized approach and engage functions were tested, and the probe successfully engaged the sample surface. Contact AFM operation was tested using a patterned calibration/sample surface. In the video below, we show an scanned image of the patterned silicon that we ran. The system successfully scanned the sample and produced recognizable topographic height images, including clearly resolved raised/recessed square features. Scan size, scan rate, feedback gains, deflection setpoint, image scaling, trace/retrace operation, and image capture functions were exercised during testing.

C-AFM/Current AFM mode was also tested. The conductive AFM controls, sample bias, current sensitivity, current channel, conductive probe/sample connections, and electrical continuity were checked. A current response was observed during testing, but a stable continuous C-AFM current image was not consistently obtained (conductivity is difficult to maintain). The resistor loop test worked perfectly and the system behaved normally, so we believe it is functioning as expected.

The TMC pneumatic vibration isolation table was also operated and checked for proper inflation/floating and isolation-table movement. However, the chuck vacuum system was not successfully tested.

We did not test liquid EC AFM due to our last of experience, but the bipotentiostat power on, was recognized, and the dummy cell tests worked in the software properly.

Overall, the system was demonstrated to power on, communicate, engage a sample, scan, and acquire usable Contact AFM topography. C-AFM current measurement portion remains incompletely verified.

Sale Includes the Following Items

1x) DI Dimensions D3100S-1 AFM Stand

1x) DI Dimensions D3100HP-2 Nanoscope Controller

1x) DI Dimensions NS3a Nanoscope IIIa ADC5 Module

1x) DI Dimensions 980-002-300 EC Universal Bipotentiostat Module

1x) DI Dimensions Nanoscope Basic Quadrex Extender Module

1x) DI Dimensions 931-000-002-R Veeco / Digital Instruments Dimension AFM Scanner Head, Standard 90 µm Open-Loop XYZ

1x) DI C-AFM add-on capability module

1x) TMC 63-30686-01 Pneumatic AFM Vibration Isolation Float Table

1x) Veeco PC w/ Windows XP OS & Nanoscope Software

1x) Bruker DT2257X20V00GRY APEM Desktop Trackball

1x) Dell CN-0N6250-71616-67H-05O4 Desktop Keyboard

1x) Dell CN-0CC280-71618-6CN-AF82 Desktop Monitor

1x) NEC LCD1770GX-BK MultiSynch LCD Monitor

3x) DI Dimensions 464-000-00X 37-Pin Module Communication Cable

1x) DI Dimensions 820-000-006 Nanoscope Power Cable

1x) 78-Pin D Sub to 8x 9-Pin Serial Communication Cable

3x) Male to Female 9-Pin Serial Communication Cable

1x) Modified Bruker DTRCH-AM C-AFM Holder

1x) Bruker DFMA Tapping/Contact/Magnetic Force AFM Probe Holder

1x) Bruker 970-017-302 EC-AFM Probe Holder  w/Skirt

1x) Bruker AFM Probe Holder Stand for swapping cantilevers

1x) Vibration and Acoustic Isolation Box with pneumatic dampening on wheels

The Following Probes are Included as well. However these do not contain full/complete sets of the cantilevers. Additionally, the condition of each individual probe has not been investigated under a microscope:

1x) Veeco MESP Sb Doped Si Magentic Force Probe

1x) Veeco FESP Sb Doped Si Probes

1x) Nano Devices 97130 BioProbe

1x) MikroMasch C031566 NSC15/3 Noncontact Si Probe

1x) MikroMasch C050163 NSC18/Cr-Au  Noncontact Conductive Probe

1x) MikroMasch C051239 NSC18/Ti-Pt Noncontact Conductive Probe

1x) MikroMasch C050854 NSC18/Co-Cr Noncontact Magnetic Force Probe

1x) K-TEK Tetra14/18 SPM Probe

1x) Bio Force Lab Methly GST.CH/COOH Probes

Probe disclaimer: included probes are bonus consumables; quantities/condition of individual cantilevers are not guaranteed.

Due to the size and weight of the entire system it must be delivered via freight shipping. Buyer responsible for the cost of freight shipping to their facility. Please note that this is a sophisticated research instrument and will require knowledgeable installation, setup, alignment, and configuration after delivery. While the system was tested and demonstrated to operate properly prior to shipment as described above, performance following freight transport may depend on proper reassembly, leveling, isolation-table setup, probe installation, optical alignment, and other routine AFM setup procedures. We do not include installation or tech support in the list price of this system. We may be able to offer it for an additional price, and also other companies can do this for an additional cost as well.

Used, see photos.

This system is exceptionally well equipped and supports a broad range of AFM/SPM techniques, including:

* Contact Mode AFM

* TappingMode AFM

* Phase Imaging

* Lateral / Friction Force Microscopy (LFM/FFM)

* Force Modulation Microscopy

* Force-Distance / Force Spectroscopy

* Force Volume Imaging

* Magnetic Force Microscopy (MFM)

* Electric Force Microscopy (EFM)

* Surface Potential / Kelvin Probe-type Imaging

* Conductive AFM (C-AFM)

* Electrochemical AFM (EC-AFM)

* Scanning Electrochemical Potential Microscopy (SECPM)

* Liquid / Electrochemical AFM

The system includes C-AFM electronics, a Universal Bipotentiostat, Quadrex extender, DFMA force-modulation holder, electrical and EC-AFM probe holders, and other specialized accessories supporting these techniques.

Contact-mode AFM was fully demonstrated with successful sample imaging. C-AFM current response was also observed. Other specialized modes should be considered hardware-supported but untested by us and may require appropriate probes, cells, or additional experiment-specific accessories.

-BJ