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THERMO MicroXR GXRC Microbeam Florescence XRF Spectrometer - NO PC

THERMO MicroXR GXRC Microbeam Florescence XRF Spectrometer - NO PC

Regular price $4,770.00 USD
Regular price Sale price $4,770.00 USD
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THERMO MicroXR GXRC Microbeam X-Ray Florescence XRF Spectrometer - NO PC


Used, these were removed from a business that is no longer in operation. Computer or software is not included, so these are not able to be tested fully as a result. In good physical condition; has a few small dents and scratches. We have 3 of them in-stock at the time of listing, message us for multiple quantity discounts. No accessories included other than what is pictured. See photos.


From The Manufacturer:

"Microbeam X-ray fluorescence (µXRF) is a revolutionary new approach to film thickness determination. Using a focused x-ray beam energy source, MicronX measures the thickness and composition of up to six layers of deposited metals simultaneously, from angstrom to micron thickness ranges.

Product detail:

The MicroXR platform of thin film measurement systems combine X-ray fluorescence (XRF), a non-contact, non-destructive spectroscopy technique with x-ray collimation to create an instrument ideally suited to the thin film measurement needs of the semiconductor, microelectronics, opto-telecommunications, and data storage industries. MicroXR measures the thickness and composition of up to six layers of deposit metals simultaneously, from angstrom to micron thickness ranges. It can also determine bulk alloy composition for up to twenty elements. The MicroXR platform consists of several configurations designed to meet specific application requirements.

Ultimate Tool for Metal Film Measurements.

Optical collimation delivers 100 times the count rate and 10 times the precision in 20µm - 100µm thickness range.

Solid state detectors provide superior sensitivity for thin (100Å–500Å) depositions, multi-layer metal stacks, and elemental peak overlap applications such as Ni/Cu

Vacuum Conduit dramatically improves accuracy and precision for elements between atomic numbers 11 and 20 (such as P, Si, and Al) without requiring sample chamber evacuation.

±2µm stage reproducibility (MicronX console platform) positions structures consistently

Zoom optics (30x–300x) enable precise X-ray beam targeting."


Machine will have to be shipped via Freight due to the large size and weight. Buyer is responsible for paying for any freight shipping costs that are accessorial (if you have a dock or forklift and it is a commercial location in the continental USA, we will ship for free). Weight is approximately 330 lbs.

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