TipsNano TGT1 SPM AFM Tip Diffraction Grating Tip Sharpness Silicon Grid Array NTMDT NT-MDT
Used, see photos. Part of the grid is slightly scratched, but other parts if the grid can be used.
From the manufacturer:
Calibration grating TGT1 is intended for
tip shape and sharpness estimation and further using in deconvolution program;
tip degradation and contamination control.
General Features
Structure the grating is formed on Si wafer top surface
Pattern type 3-D array of sharp tips
Period 3±0,05 µm
Height 0.3 - 0.5µm
Chip size 5x5x0,5 mm
Effective area central square 2x2 mm
Tip angle 50±10 degrees (on the very tip end)
Tip curvature radius ≤10nm
Diagonal period 2,12 µm
Test grating TGT1 is intended for:
- for 3-D visualization of the scanning tip;
- determination of tip sharpness parameters (aspect ratio), tip degradation and contamination control.
